- cats-test and picc_to_pcsc are using the same pcsc abstraction. this reduces the code to maintain

- partial rewrite of picc_to_pcsc to reduce memory leaks and add fault tolerancy


git-svn-id: https://vsmartcard.svn.sourceforge.net/svnroot/vsmartcard@300 96b47cad-a561-4643-ad3b-153ac7d7599c

picc_to_pcsc/src/picc_to_pcsc.h

@@ -4,18 +4,10 @@
 #define PICCDEV "/dev/ttyACM0"
 
 typedef void (*sighandler_t)(int);
-/*Global variables*/
-FILE *fd; /*filehandle used for PICCDEV*/
-SCARDCONTEXT hcontext;
-SCARDHANDLE hcard;
-SCARD_READERSTATE rstate;
-
-char reader_name[MAX_READERNAME];
 
 static sighandler_t register_sig(int signo, sighandler_t sighandler);
 void checkSig(int signo);
 unsigned int read_from_device(unsigned char *inputBuffer);
-int transmit_to_pcsc(unsigned char *inputBuffer, unsigned int inputLength, unsigned char *outputBuffer, unsigned int *outputLength);
 void write_to_device(unsigned char *buffer, unsigned int msglength);
 void setup(void);
 void cleanup(void);